Metrology conferences

The conference examines engineered systems that use superposition and entanglement for computing, communication and measurement. Topics range from computing fundamentals and architectures to networking devices, quantum sensors and metrology. Researchers from universities, industry, government and national laboratories will discuss technical progress and the ecosystems needed to turn it into useful technologies. Co-location with the Quantum Executive Forum connects scientific developments with emerging products and applications.

The meeting examines how coherence, entanglement, correlations and control improve measurement. Platforms include spin defects, atoms and ions, photonic and levitated systems, and molecular or biological sensors. Discussion addresses noise, decoherence, readout, fabrication and calibration alongside robustness and scalability. Applications range from nanoscale materials and living systems to medical imaging, geoscience, navigation, precision gravity and searches for new physics. A further focus is translating laboratory sensors into reliable devices for practical use. Attendance requires a bachelor’s degree in science or engineering, or an accepted equivalent. Applications are subject to selection and available capacity.

This conference explores how controlled quantum dynamics enable computing, simulation, sensing and metrology. It spans atoms, molecules, nanoscale structures, interacting many-body systems and qubits, from ultrafast phenomena to long-time evolution. Sessions examine quantum thermodynamics, chirality, coherent nanoscale effects, engineered dynamics and AI-assisted control. Theory and experiment will be compared across platforms, with poster sessions and selected short presentations supporting discussion of unpublished research. Attendance requires a bachelor’s degree in science or engineering, or an accepted equivalent. Applications are subject to selection and available capacity.